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ET
2002
64views more  ET 2002»
15 years 6 months ago
Structural Fault Based Specification Reduction for Testing Analog Circuits
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen
STVR
2002
111views more  STVR 2002»
15 years 6 months ago
Can fault-exposure-potential estimates improve the fault detection abilities of test suites?
Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as statements, basic blocks, or outcomes of decisions) as equal. In practice, how...
Wei Chen, Roland H. Untch, Gregg Rothermel, Sebast...
TCS
2002
15 years 6 months ago
Authentication tests and the structure of bundles
Suppose a principal in a cryptographic protocol creates and transmits a message containing a new value v, later receiving v back in a different cryptographic context. It can concl...
Joshua D. Guttman, F. Javier Thayer
TSE
2002
87views more  TSE 2002»
15 years 6 months ago
A Formal Model of the Software Test Process
João W. Cangussu, Raymond A. DeCarlo, Adity...
ET
2007
57views more  ET 2007»
15 years 6 months ago
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
In this paper, we explore general conditions for the oscillation based test of switched-capacitor biquad filter stages. Expressions describing the characteristics of a filter stage...
Uros Kac, Franc Novak