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167
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ITC
1993
IEEE
15 years 11 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
147
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ATS
2004
IEEE
15 years 10 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
168
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GECCO
2006
Springer
15 years 10 months ago
2006
Springer
Existing test problems for multi-objective optimization are criticized for not having adequate linkages among variables. In most problems, the Pareto-optimal solutions correspond ...
189
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ANSS
2001
IEEE
15 years 10 months ago
2001
IEEE
In this paper, we employ the finite state machine (FSM) model for networks to investigate fault identification using passive testing. First, we introduce the concept of passive te...
159
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AGILEDC
2009
IEEE
15 years 10 months ago
2009
IEEE
A Continuous Integration system is often considered one of the key elements involved in supporting an agile software development and testing environment. As a traditional software...