21183 search results - page 443 / 4237 » Adaptive Testing by Test |
196
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RSP
1998
IEEE
15 years 11 months ago
1998
IEEE
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
172
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ITC
1997
IEEE
15 years 11 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
178
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SIGCSE
1997
ACM
15 years 11 months ago
1997
ACM
One of the major difficulties facing anyone trying to teach the first programming course is how to encourage students to thoroughly test their programs. We would argue that the ma...
183
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CSL
1997
Springer
15 years 11 months ago
1997
Springer
We present a complete axiomatization of test algebra ( 24, 18, 29]), the two-sorted algebraic variant of Propositional Dynamic Logic (PDL, 21, 7]). The axiomatization consists of ...
145
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ITC
1996
IEEE
15 years 11 months ago
1996
IEEE
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...