21183 search results - page 442 / 4237 » Adaptive Testing by Test |
145
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SIGDOC
2000
ACM
15 years 11 months ago
2000
ACM
∗ This paper introduces low-tech simulation as a technique for testing procedures and their documentation. The key idea is to test the interface-procedure-documentation set in th...
175
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COMPSAC
1999
IEEE
15 years 11 months ago
1999
IEEE
In this paper, we study the optimal software release problem considering cost, reliability and testing eficiency. We first propose a generalized logistic testing-effort function t...
185
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The proposed microcode-based memory BIST unit is more e ci...
226
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ATS
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
179
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ICCAD
1998
IEEE
15 years 11 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...