21183 search results - page 441 / 4237 » Adaptive Testing by Test |
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DELTA
2002
IEEE
15 years 11 months ago
2002
IEEE
: The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a lar...
170
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
184
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
154
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
168
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed metho...