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153
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DATE
2006
IEEE
110views Hardware» more  DATE 2006»
16 years 26 days ago
An improved RF loopback for test time reduction
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
ISSRE
2006
IEEE
16 years 24 days ago
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool
In a Model-Driven Development context (MDE), model transformations allow memorizing and reusing design know-how, and thus automate parts of the design and refinement steps of a so...
Erwan Brottier, Franck Fleurey, Jim Steel, Benoit ...
KBSE
2006
IEEE
16 years 24 days ago
Command-Form Coverage for Testing Database Applications
The testing of database applications poses new challenges for software engineers. In particular, it is difficult to thoroughly test the interactions between an application and it...
William G. J. Halfond, Alessandro Orso
ISCAS
2005
IEEE
153views Hardware» more  ISCAS 2005»
16 years 11 days ago
A two-step DDEM ADC for accurate and cost-effective DAC testing
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
Hanqing Xing, Degang Chen, Randall L. Geiger
KBSE
2005
IEEE
16 years 11 days ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power