—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...
Erik Jan Marinissen, Dae Young Lee, John P. Hayes,...
The goal of a load test is to uncover functional and performance problems of a system under load. Performance problems refer to the situations where a system suffers from unexpect...
Zhen Ming Jiang, Ahmed E. Hassan, Gilbert Hamann, ...
Unit testing component-based distributed systems traditionally involved testing functional concerns of the application logic throughout the development lifecycle. In contrast, tes...
James H. Hill, Hamilton A. Turner, James R. Edmond...