21183 search results - page 424 / 4237 » Adaptive Testing by Test |
158
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VTS
2005
IEEE
16 years 10 days ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
128
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DATE
2003
IEEE
16 years 2 days ago
2003
IEEE
: Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Designfor-Manufacturability. We present a case study of an SoC test concept, including a...
106
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ITC
2003
IEEE
16 years 1 days ago
2003
IEEE
We present a measurement module that computes the charge from the transient supply current and provides a digital value of this magnitude. The module is constructed to provide a f...
164
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GECCO
2003
Springer
15 years 12 months ago
2003
Springer
Several researchers are using evolutionary search methods to search for test data with which to test a program. The fitness or cost function depends on the test goal but almost in...
174
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MTDT
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...