21183 search results - page 423 / 4237 » Adaptive Testing by Test |
140
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Testing today of a several hundred million transistor System-on-Chip with analog, RF blocks, many processor cores and tens of memories is a huge task. What will test technology be...
171
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DFT
2007
IEEE
16 years 1 months ago
2007
IEEE
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
156
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HASE
2007
IEEE
16 years 1 months ago
2007
IEEE
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...
152
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
174
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ISSRE
2006
IEEE
16 years 24 days ago
2006
IEEE
Moving program code that implements cross-cutting concerns into aspects can improve the maintainability of legacy systems. This kind of refactoring, called aspectualization, can a...