21183 search results - page 422 / 4237 » Adaptive Testing by Test |
129
Voted
ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
136
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
163
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ICASSP
2008
IEEE
16 years 1 months ago
2008
IEEE
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
169
Voted
VLSID
2008
IEEE
16 years 1 months ago
2008
IEEE
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
161
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...