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ISSTA
2012
ACM
13 years 9 months ago
Isolating failure causes through test case generation
Manual debugging is driven by experiments—test runs that narrow down failure causes by systematically confirming or excluding individual factors. The BUGEX approach leverages t...
Jeremias Röbetaler, Gordon Fraser, Andreas Ze...
VLSID
2007
IEEE
94views VLSI» more  VLSID 2007»
16 years 7 months ago
A Reduced Complexity Algorithm for Minimizing N-Detect Tests
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
Kalyana R. Kantipudi, Vishwani D. Agrawal
RECOMB
2005
Springer
16 years 7 months ago
Power Boosts for Cluster Tests
Abstract. Gene cluster significance tests that are based on the number of genes in a cluster in two genomes, and how compactly they are distributed, but not their order, may be mad...
David Sankoff, Lani Haque
STOC
2005
ACM
132views Algorithms» more  STOC 2005»
16 years 7 months ago
Locally decodable codes with 2 queries and polynomial identity testing for depth 3 circuits
In this work we study two, seemingly unrelated, notions. Locally Decodable Codes (LDCs) are codes that allow the recovery of each message bit from a constant number of entries of ...
Zeev Dvir, Amir Shpilka
SODA
2010
ACM
133views Algorithms» more  SODA 2010»
16 years 4 months ago
Testing additive integrality gaps
We consider the problem of testing whether the maximum additive integrality gap of a family of integer programs in standard form is bounded by a given constant. This can be viewed...
Friedrich Eisenbrand, Nicolai Hähnle, Dömötör ...