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ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
16 years 1 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
VTS
2007
IEEE
95views Hardware» more  VTS 2007»
16 years 1 months ago
Delay Test Quality Evaluation Using Bounded Gate Delays
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
Soumitra Bose, Vishwani D. Agrawal
APPROX
2007
Springer
153views Algorithms» more  APPROX 2007»
16 years 28 days ago
Distribution-Free Testing Lower Bounds for Basic Boolean Functions
: In the distribution-free property testing model, the distance between functions is measured with respect to an arbitrary and unknown probability distribution D over the input dom...
Dana Glasner, Rocco A. Servedio
SIGSOFT
2006
ACM
16 years 21 days ago
Simulation-based test adequacy criteria for distributed systems
Developers of distributed systems routinely construct discrete-event simulations to help understand and evaluate the behavior of inter-component protocols. Simulations are abstrac...
Matthew J. Rutherford, Antonio Carzaniga, Alexande...
APSEC
2005
IEEE
16 years 11 days ago
An Integrated Solution for Testing and Analyzing Java Applications in an Industrial Setting
Testing a large-scale, real-life commercial software application is a very challenging task due to the constant changes in the software, the involvement of multiple programmers an...
W. Eric Wong, J. Jenny Li