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156
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DATE
2006
IEEE
16 years 24 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
177
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DFT
2006
IEEE
16 years 24 days ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
183
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ETS
2006
IEEE
16 years 24 days ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
197
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ISSRE
2006
IEEE
16 years 22 days ago
2006
IEEE
—Graphical user interfaces (GUIs) are used as front ends to most of today’s software applications. The event-driven nature of GUIs presents new challenges for testing. One impo...
198
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QSIC
2005
IEEE
16 years 9 days ago
2005
IEEE
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...