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DFT
2009
IEEE
189views VLSI» more  DFT 2009»
16 years 1 months ago
Analyzing Formal Verification and Testing Efforts of Different Fault Tolerance Mechanisms
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
Meng Zhang, Anita Lungu, Daniel J. Sorin
ICC
2009
IEEE
180views Communications» more  ICC 2009»
16 years 1 months ago
Composite Hypothesis Testing for Cooperative Spectrum Sensing in Cognitive Radio
—In this paper, we present a composite hypothesis testing approach for cooperative spectrum sensing. We derive the optimal likelihood ratio test (LRT) statistic based on the Neym...
Sepideh Zarrin, Teng Joon Lim
KBSE
2009
IEEE
16 years 1 months ago
Reggae: Automated Test Generation for Programs Using Complex Regular Expressions
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
Nuo Li, Tao Xie, Nikolai Tillmann, Jonathan de Hal...
GECCO
2009
Springer
163views Optimization» more  GECCO 2009»
16 years 1 months ago
Dealing with inheritance in OO evolutionary testing
Most of the software developed in the world follows the object-oriented (OO) paradigm. However, the existing work on evolutionary testing is mainly targeted to procedural language...
Javier Ferrer, J. Francisco Chicano, Enrique Alba
ASPDAC
2009
ACM
262views Hardware» more  ASPDAC 2009»
16 years 1 months ago
Fault modeling and testing of retention flip-flops in low power designs
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, ...