21183 search results - page 382 / 4237 » Adaptive Testing by Test |
152
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TSD
2000
Springer
15 years 10 months ago
2000
Springer
In this article, we present a test environment for a word analysis system that is used for reliable and sense-conveying hyphenation of German words. A crucial task is the hyphenati...
167
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VTS
1995
IEEE
15 years 10 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
210
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ICCAD
1991
IEEE
15 years 10 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
156
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COCO
2006
Springer
15 years 8 months ago
2006
Springer
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin...
192
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EVOW
2008
Springer
15 years 8 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...