21183 search results - page 380 / 4237 » Adaptive Testing by Test |
145
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ITC
1997
IEEE
15 years 11 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
165
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VTS
1997
IEEE
15 years 11 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
178
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
190
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ICCAD
2007
IEEE
15 years 10 months ago
2007
IEEE
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
202
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AGILEDC
2004
IEEE
15 years 10 months ago
2004
IEEE
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...