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DATE
1998
IEEE
15 years 11 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
171
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HASE
1998
IEEE
15 years 11 months ago
1998
IEEE
It is widely accepted that the OO paradigm will signi cantly increase software reusability, extendibility, interoperability, and reliability. This is also true for high assurance ...
174
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IPPS
1998
IEEE
15 years 11 months ago
1998
IEEE
We propose a periodic diagnostic algorithm based on the testing model of computation for real-time systems. The diagnostic task runs on every processor of the system. When the task...
163
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TOOLS
1998
IEEE
15 years 11 months ago
1998
IEEE
Object-orientation has rapidly become accepted as the preferred paradigm for large scale system design. There is considerable literature describing approaches to object-oriented d...
169
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DFT
1997
IEEE
15 years 11 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...