21183 search results - page 371 / 4237 » Adaptive Testing by Test |
157
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DAC
2000
ACM
16 years 7 months ago
2000
ACM
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
171
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
181
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
158
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ICSE
2005
IEEE-ACM
16 years 6 months ago
2005
IEEE-ACM
AGENDA is a tool set for testing relational database applications. An earlier prototype was targeted to applications consisting of a single query and included components for popul...
184
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ESOP
2010
Springer
16 years 4 months ago
2010
Springer
Abstract. This paper is concerned with testing properties of polymorphic functions. The problem is that testing can only be performed on specific monomorphic instances, whereas par...