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ITC
1996
IEEE
83views Hardware» more  ITC 1996»
15 years 11 months ago
Test Generation for Global Delay Faults
This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
G. M. Luong, D. M. H. Walker
ICSM
1993
IEEE
15 years 10 months ago
Incremental Regression Testing
The purpose of regression testing is to ensure that bug xes and new functionality introduced in a new version of a software do not adversely a ect the correct functionality inheri...
Hiralal Agrawal, Joseph Robert Horgan, Edward W. K...
ICSE
2000
IEEE-ACM
15 years 10 months ago
Testing levels for object-oriented software
One of the characteristicsof object-oriented software is the complex dependency that may exist between classes due to inheritance, association and aggregation relationships. Hence...
Yvan Labiche, Pascale Thévenod-Fosse, H&eac...
FLOPS
2008
Springer
15 years 8 months ago
EasyCheck - Test Data for Free
Abstract. We present a lightweight, automated tool for specificationbased testing of declarative programs written in the functional logic programming language Curry and emphasize t...
Jan Christiansen, Sebastian Fischer
MBEES
2008
15 years 8 months ago
Composition of Model-based Test Coverage Criteria
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...