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146
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ITC
1996
IEEE
15 years 11 months ago
1996
IEEE
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...
154
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VTS
1996
IEEE
15 years 10 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
170
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ITC
1993
IEEE
15 years 10 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
175
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ECOOP
2007
Springer
15 years 10 months ago
2007
Springer
Refactoring is not only useful for source code of implementations, but as well for test specifications. The open source TRex tool automates the application of refactorings and the ...
178
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DATE
2004
IEEE
15 years 10 months ago
2004
IEEE
There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majorit...