21183 search results - page 362 / 4237 » Adaptive Testing by Test |
181
Voted
ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretica...
143
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
156
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to ena...
160
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...
171
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VTS
1999
IEEE
15 years 11 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...