21183 search results - page 361 / 4237 » Adaptive Testing by Test |
126
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
126
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
179
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LOPSTR
2009
Springer
15 years 11 months ago
2009
Springer
In this paper, we propose an approach for automated test case generation based on techniques from constraint programming (CP). We advocate the use of standard CP search strategies ...
165
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ATS
2000
IEEE
15 years 11 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
146
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...