21183 search results - page 360 / 4237 » Adaptive Testing by Test |
185
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PVM
2007
Springer
16 years 24 days ago
2007
Springer
Abstract. MPI implementations are faced with growingly complex network configurations containing multiple network interfaces per node, NAT, or dual stacks. To implement handling l...
143
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ETS
2006
IEEE
16 years 22 days ago
2006
IEEE
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
137
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DATE
2005
IEEE
16 years 9 days ago
2005
IEEE
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
134
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
143
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...