21183 search results - page 351 / 4237 » Adaptive Testing by Test |
152
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
The objective of this paper is to define a minimum number of configurations for testing the configurable modules that interface the global interconnect and the logic cells of SRAM...
184
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ISORC
1998
IEEE
15 years 11 months ago
1998
IEEE
Many real-time systems evolve over time due to new requirements and technology improvements. Each revision requires regression testing to ensure that existing functionality is not...
199
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APSEC
1996
IEEE
15 years 10 months ago
1996
IEEE
Testing of concurrent programs is much more difficult than that of sequential programs. A concurrent program behaves nondeterministically, that is, the program may produce differe...
166
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DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
175
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DDECS
2009
IEEE
15 years 10 months ago
2009
IEEE
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...