21183 search results - page 350 / 4237 » Adaptive Testing by Test |
184
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...
190
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
184
Voted
COMPSAC
2009
IEEE
15 years 11 months ago
2009
IEEE
—In continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more ef...
168
Voted
ICSE
2009
IEEE-ACM
15 years 11 months ago
2009
IEEE-ACM
In ICSE’08 we demonstrated the Java UML Lightweight Enumerator (JULE) tool, which supports compliance test generation from modeling standards specifications. When employed in ou...
204
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APAQS
2000
IEEE
15 years 11 months ago
2000
IEEE
Recently, the extraordinarygrowth in the World Wide Web has been sweeping through business and industry. Many companies have developed or integrated their mission-critical applica...