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DAC
1997
ACM
15 years 10 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
ASPDAC
2007
ACM
101views Hardware» more  ASPDAC 2007»
15 years 10 months ago
Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...
HASE
2007
IEEE
15 years 10 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
APSEC
2004
IEEE
15 years 10 months ago
An Approach to Detecting Domain Errors Using Formal Specification-Based Testing
Domain testing, a technique for testing software or portions of software dominated by numerical processing, is intended to detect domain errors that usually arise from incorrect i...
Yuting Chen, Shaoying Liu
APSEC
2004
IEEE
15 years 10 months ago
Testing Java Interrupts and Timed Waits
Testing concurrent software is difficult due to problems with inherent non-determinism. In previous work, we have presented a method and tool support for the testing of concurrent...
Luke Wildman, Brad Long, Paul A. Strooper