21183 search results - page 334 / 4237 » Adaptive Testing by Test |
218
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EVOW
1999
Springer
15 years 11 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
150
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ICCAD
1998
IEEE
15 years 11 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
148
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ICCAD
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
167
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KBSE
1998
IEEE
15 years 11 months ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
134
Voted
ATS
1997
IEEE
15 years 11 months ago
1997
IEEE
This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at fault models. In the first part, we prese...