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182
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
168
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FOCS
2002
IEEE
15 years 11 months ago
2002
IEEE
We consider the problem of testing functions for the property of being a k-junta (i.e., of depending on at most k variables). Fischer, Kindler, Ron, Safra, and Samorodnitsky (J. Co...
167
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ICPR
2002
IEEE
15 years 11 months ago
2002
IEEE
Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (sta...
183
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ISSRE
2002
IEEE
15 years 11 months ago
2002
IEEE
Object-oriented programs cause a shift in focus from software units to the way software classes and components are connected. Thus, we are finding that we need less emphasis on un...
180
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...