21183 search results - page 330 / 4237 » Adaptive Testing by Test |
158
click to vote
ISSRE
2003
IEEE
15 years 12 months ago
2003
IEEE
Use-cases and scenarios have been identified as good inputs to generate test cases and oracles at requirement level. Yet to have an automated generation, information is missing f...
156
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This work discusses the impact of power consumption on the test time of core-based systems, when an available on-chip network is reused as test access mechanism. A previously prop...
140
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
151
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
167
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...