21183 search results - page 325 / 4237 » Adaptive Testing by Test |
155
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exace...
158
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ATS
2009
IEEE
16 years 1 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
161
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ICASSP
2009
IEEE
16 years 1 months ago
2009
IEEE
In this paper we propose a nonparametric hypothesis test for stationarity based on local Fourier analysis. We employ a test statistic that measures the variation of time-localized...
200
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TASE
2009
IEEE
16 years 1 months ago
2009
IEEE
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
170
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ERSHOV
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. The article concerns problems of formulating standard requirements to implementations of mathematical functions working with floating-point numbers and conformance test ...