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TIT
2011
157views more  TIT 2011»
15 years 1 months ago
Universal and Composite Hypothesis Testing via Mismatched Divergence
—For the universal hypothesis testing problem, where the goal is to decide between the known null hypothesis distribution and some other unknown distribution, Hoeffding proposed ...
Jayakrishnan Unnikrishnan, Dayu Huang, Sean P. Mey...
DAC
2001
ACM
16 years 7 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
ICSE
2007
IEEE-ACM
16 years 6 months ago
Compatibility and Regression Testing of COTS-Component-Based Software
Software engineers frequently update COTS components integrated in component-based systems, and can often chose among many candidates produced by different vendors. This paper tac...
Leonardo Mariani, Mauro Pezzè, Sofia Papagi...
ICCD
2006
IEEE
116views Hardware» more  ICCD 2006»
16 years 3 months ago
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
ICCD
2003
IEEE
145views Hardware» more  ICCD 2003»
16 years 3 months ago
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
Bernd Könemann