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DDECS
2007
IEEE
90views Hardware» more  DDECS 2007»
15 years 10 months ago
Test Pattern Generator for Delay Faults
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Tomasz Rudnicki, Andrzej Hlawiczka
ATVA
2006
Springer
102views Hardware» more  ATVA 2006»
15 years 10 months ago
A Semantic Framework for Test Coverage
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
Laura Brandán Briones, Ed Brinksma, Mari&eu...
BMCBI
2005
93views more  BMCBI 2005»
15 years 6 months ago
Two-part permutation tests for DNA methylation and microarray data
Background: One important application of microarray experiments is to identify differentially expressed genes. Often, small and negative expression levels were clipped-off to be e...
Markus Neuhäuser, Tanja Boes, Karl-Heinz J&ou...
ISSRE
2010
IEEE
15 years 5 months ago
Automating System Tests Using Declarative Virtual Machines
—Automated regression test suites are an essential software engineering practice: they provide developers with rapid feedback on the impact of changes to a system’s source code...
Sander van der Burg, Eelco Dolstra
ISSRE
2010
IEEE
15 years 5 months ago
Is Data Privacy Always Good for Software Testing?
—Database-centric applications (DCAs) are common in enterprise computing, and they use nontrivial databases. Testing of DCAs is increasingly outsourced to test centers in order t...
Mark Grechanik, Christoph Csallner, Chen Fu, Qing ...