21183 search results - page 315 / 4237 » Adaptive Testing by Test |
172
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
In this paper, we analyze the use of UML as a starting point to go from design issues to end of production testing of complex embedded systems. The first point is the analysis of ...
205
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
173
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
182
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ITC
2002
IEEE
15 years 11 months ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
202
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KBSE
2002
IEEE
15 years 11 months ago
2002
IEEE
In this paper we present a concept for automated testing of object-oriented applications and a tool called SeDiTeC that implements these concepts for Java applications. SeDiTeC us...