21183 search results - page 305 / 4237 » Adaptive Testing by Test |
148
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IPPS
1998
IEEE
15 years 11 months ago
1998
IEEE
In this paper, we generalize the test. The generalized test can be applied towards determining whether there exist data dependences for coupled arrays with both constant and var...
153
Voted
SACRYPT
1998
Springer
15 years 10 months ago
1998
Springer
Maurer's universal test is a very common randomness test, capable of detecting a wide gamut of statistical defects. The algorithm is simple (a few Java code lines), flexible (...
246
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CAV
2006
Springer
15 years 10 months ago
2006
Springer
CUTE, a Concolic Unit Testing Engine for C and Java, is a tool to systematically and automatically test sequential C programs (including pointers) and concurrent Java programs. CUT...
162
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ITC
1995
IEEE
15 years 10 months ago
1995
IEEE
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
158
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IWANN
1995
Springer
15 years 10 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...