21183 search results - page 304 / 4237 » Adaptive Testing by Test |
187
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
179
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
146
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
152
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
160
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...