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ITC
1991
IEEE
86views Hardware» more  ITC 1991»
15 years 10 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee
ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 10 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
CODES
2008
IEEE
15 years 8 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
Heon-Mo Koo, Prabhat Mishra
DBSEC
2008
137views Database» more  DBSEC 2008»
15 years 8 months ago
Towards Automation of Testing High-Level Security Properties
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...
Aiman Hanna, Hai Zhou Ling, Jason Furlong, Mourad ...
PTS
2000
58views Hardware» more  PTS 2000»
15 years 8 months ago
Formal Test Automation: The Conference Protocol with PHACT
We discuss a case study of automatic test generation and test execution based on formal methods. The case is the Conference Protocol, a simple, chatbox-like protocol, for which (fo...
Lex Heerink, Jan Feenstra, Jan Tretmans