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ITC
1998
IEEE
71views Hardware» more  ITC 1998»
15 years 10 months ago
A structured and scalable mechanism for test access to embedded reusable cores
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard...
VTS
1998
IEEE
98views Hardware» more  VTS 1998»
15 years 10 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
KBSE
1997
IEEE
15 years 10 months ago
Genetic Algorithms for Dynamic Test Data Generation
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...
Christoph C. Michael, Gary McGraw, Michael Schatz,...
ICECCS
1996
IEEE
209views Hardware» more  ICECCS 1996»
15 years 10 months ago
Coupling-based Integration Testing
This research is part of a project to develop practical, effective, formalizable, automatable techniques for integration testing. Integration testing is an important part of the t...
Zhenyi Jin, A. Jefferson Offutt
ASWEC
2007
IEEE
15 years 10 months ago
Managing Conflicts When Using Combination Strategies to Test Software
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
Mats Grindal, Jeff Offutt, Jonas Mellin