21183 search results - page 294 / 4237 » Adaptive Testing by Test |
173
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ICECCS
2000
IEEE
15 years 11 months ago
2000
IEEE
This research is part of a project to develop practical, effective, formalizable, automatable techniques for integration testing. Integration testing is an important part of the t...
202
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COMPSAC
1999
IEEE
15 years 11 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
194
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
174
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ICCD
1999
IEEE
15 years 11 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
180
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ICSE
1999
IEEE-ACM
15 years 11 months ago
1999
IEEE-ACM
Structural coverage criteria are often used as an indicator of the thoroughness of testing, but complete satisfaction of a criterion is seldom achieved. When a software product is...