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APLAS
2006
ACM
16 years 17 days ago
Automatic Testing of Higher Order Functions
This paper tackles a problem often overlooked in functional programming community: that of testing. Fully automatic test tools like Quickcheck and G∀ST can test first order func...
Pieter W. M. Koopman, Rinus Plasmeijer
QSIC
2005
IEEE
16 years 5 days ago
Towards a Metamorphic Testing Methodology for Service-Oriented Software Applications
Testing applications in service-oriented architecture (SOA) environments needs to deal with issues like the unknown communication partners until the service discovery, the impreci...
W. K. Chan, S. C. Cheung, Karl R. P. H. Leung
VLSID
2005
IEEE
120views VLSI» more  VLSID 2005»
16 years 5 days ago
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
VTS
2005
IEEE
95views Hardware» more  VTS 2005»
16 years 5 days ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
16 years 4 days ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...