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163
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
171
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VTS
2007
IEEE
16 years 26 days ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
163
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FC
2007
Springer
16 years 23 days ago
2007
Springer
We argue that phishing IQ tests fail to measure susceptibility to phishing attacks. We conducted a study where 40 subjects were asked to answer a selection of questions from exist...
165
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XPU
2007
Springer
16 years 21 days ago
2007
Springer
Testing is an essential part of an agile process as test is automated and tends to take the role of specifications in place of documents. However, whenever test cases are faulty, d...
149
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COMPSAC
2006
IEEE
16 years 19 days ago
2006
IEEE
Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible. The sizes of test suites grow as software evolv...