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ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
16 years 3 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
IUI
2010
ACM
16 years 1 months ago
Lowering the barriers to website testing with CoTester
In this paper, we present CoTester, a system designed to decrease the difficulty of testing web applications. CoTester allows testers to create test scripts that are represented ...
Jalal Mahmud, Tessa Lau
DATE
2009
IEEE
105views Hardware» more  DATE 2009»
16 years 1 months ago
Enrichment of limited training sets in machine-learning-based analog/RF test
Abstract— This paper discusses the generation of informationrich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of ...
Haralampos-G. D. Stratigopoulos, Salvador Mir, Yio...
COMPSAC
2008
IEEE
16 years 1 months ago
Mutation-Based Testing of Buffer Overflow Vulnerabilities
Buffer overflow (BOF) is one of the major vulnerabilities that leads to non-secure software. Testing an implementation for BOF vulnerabilities is challenging as the underlying rea...
Hossain Shahriar, Mohammad Zulkernine
DATE
2008
IEEE
66views Hardware» more  DATE 2008»
16 years 1 months ago
Optimal Margin Computation for At-Speed Test
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...