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ICSE
2009
IEEE-ACM
15 years 4 months ago
Configuration aware prioritization techniques in regression testing
Configurable software lets users customize applications in many ways, and is becoming increasingly prevalent. Regression testing is an important but expensive way to build confide...
Xiao Qu
CORR
2011
Springer
200views Education» more  CORR 2011»
15 years 1 months ago
Sequential Analysis in High Dimensional Multiple Testing and Sparse Recovery
—This paper studies the problem of high-dimensional multiple testing and sparse recovery from the perspective of sequential analysis. In this setting, the probability of error is...
Matt Malloy, Robert Nowak
TE
2010
168views more  TE 2010»
15 years 1 months ago
Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
John Hu, Mark Haffner, Samantha Yoder, Mark Scott,...
DAC
2008
ACM
16 years 7 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
SIGMOD
2008
ACM
65views Database» more  SIGMOD 2008»
16 years 6 months ago
Generating targeted queries for database testing
Tools for generating test queries for databases do not explicitly take into account the actual data in the database. As a consequence, such tools cannot guarantee suitable coverag...
Chaitanya Mishra, Nick Koudas, Calisto Zuzarte