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ENGL
2007
180views more  ENGL 2007»
15 years 6 months ago
Reordering Algorithm for Minimizing Test Power in VLSI Circuits
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
K. Paramasivam, K. Gunavathi
TAP
2008
Springer
102views Hardware» more  TAP 2008»
15 years 6 months ago
Functional Testing in the Focal Environment
This article presents the generation and test case execution under the framework Focal. In the programming language Focal, all properties of the program are written within the sour...
Matthieu Carlier, Catherine Dubois
ET
1998
52views more  ET 1998»
15 years 6 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
CORR
1999
Springer
110views Education» more  CORR 1999»
15 years 6 months ago
Managing Object-Oriented Integration and Regression Testing
Abstract: Systematic testing of object-oriented software turned out to be much more complex than testing conventional software. Especially the highly incremental and iterative deve...
Mario Winter
INLG
2010
Springer
15 years 4 months ago
Generating Natural Language Descriptions of Z Test Cases
Critical software most often requires an independent validation and verification (IVV). IVV is usually performed by domain experts, who are not familiar with specific, many times ...
Maximiliano Cristiá, Brian Plüss