21183 search results - page 283 / 4237 » Adaptive Testing by Test |
189
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
193
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SIGUCCS
1999
ACM
15 years 11 months ago
1999
ACM
The University of Portland Office of Computer and Telecommunication Services (CTS) created an Intranet web site for the University community during the summer of 1998. In the summ...
170
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VTS
1998
IEEE
15 years 10 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
171
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DATE
1997
IEEE
15 years 10 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
145
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DATE
1997
IEEE
15 years 10 months ago
1997
IEEE
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...