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APAQS
2000
IEEE
15 years 11 months ago
Testing for Imperfect Integration of Legacy Software Components
In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-teste...
David Flater
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 11 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
DATE
2000
IEEE
134views Hardware» more  DATE 2000»
15 years 11 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee
ISSTA
2000
ACM
15 years 11 months ago
OMEN: A strategy for testing object-oriented software
This paper presents a strategy for structural testing of objectoriented software systems with possibly unknown clients and unknown information about invoked methods. By exploiting...
Amie L. Souter, Lori L. Pollock
DATE
1999
IEEE
73views Hardware» more  DATE 1999»
15 years 11 months ago
Channel-Based Behavioral Test Synthesis for Improved Module Reachability
We introduce a novel behavioral test synthesis methodology that attempts to increase module reachability, driven by powerful global design path analysis. Based on the notion of tr...
Yiorgos Makris, Alex Orailoglu