21183 search results - page 280 / 4237 » Adaptive Testing by Test |
152
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ATS
2003
IEEE
15 years 12 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
176
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COMPSAC
2003
IEEE
15 years 12 months ago
2003
IEEE
Effectiveness of testing criteria is the ability to detect failures in a software program. We consider not only effectiveness of some testing criterion in itself but a variance of...
146
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
108
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconduc...
177
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DAC
2003
ACM
15 years 11 months ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...