21183 search results - page 278 / 4237 » Adaptive Testing by Test |
139
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DATE
2006
IEEE
16 years 19 days ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
158
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GLVLSI
2006
IEEE
16 years 19 days ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
159
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ATS
2005
IEEE
16 years 6 days ago
2005
IEEE
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
162
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CEC
2005
IEEE
16 years 6 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
180
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DATE
2005
IEEE
16 years 5 days ago
2005
IEEE
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...