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ISCAS
2003
IEEE
110views Hardware» more  ISCAS 2003»
15 years 12 months ago
A modular test structure for CMOS mismatch characterization
In this work a new test structure for mismatch characterization of CMOS technologies is presented. The test structure is modular, with a reduced area and it can be inserted in the...
Massimo Conti, Paolo Crippa, Francesco Fedecostunt...
DATE
2002
IEEE
77views Hardware» more  DATE 2002»
15 years 11 months ago
An Optimal Algorithm for the Automatic Generation of March Tests
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale...
ISSRE
2000
IEEE
15 years 11 months ago
Evaluation of Regressive Methods for Automated Generation of Test Trajectories
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
Brian J. Taylor, Bojan Cukic
CORR
2008
Springer
103views Education» more  CORR 2008»
15 years 6 months ago
When, why and how to test spreadsheets
Testing is a vital part of software development, and spreadsheets are like any other software in this respect. This paper discusses the testing of spreadsheets in the light of one...
Louise Pryor
EOR
2008
80views more  EOR 2008»
15 years 6 months ago
Few statistical tests for proportions comparison
This article reviews a number of statistical tests for comparing proportions. These statistical tests are presented in a comprehensive way, so that OR practitioners can easily und...
Éric D. Taillard, Philippe Waelti, Jacques ...