21183 search results - page 267 / 4237 » Adaptive Testing by Test |
170
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COMPSAC
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper presents a temporal model for the coverage achieved by software testing. The proposed model, which is applicable at any level of the testing hierarchy, can determine th...
180
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
159
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ISSRE
2002
IEEE
15 years 11 months ago
2002
IEEE
Spreadsheet languages are widely used by a variety of end users to perform many important tasks. Despite their perceived simplicity, spreadsheets often contain faults. Furthermore...
148
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DATE
1998
IEEE
15 years 10 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
173
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...