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DATE
2005
IEEE
110views Hardware» more  DATE 2005»
16 years 5 days ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu...
DATE
2005
IEEE
107views Hardware» more  DATE 2005»
16 years 5 days ago
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chak...
ICSM
2005
IEEE
16 years 4 days ago
Call Stack Coverage for Test Suite Reduction
Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software developm...
Scott McMaster, Atif M. Memon
ICSM
2005
IEEE
16 years 4 days ago
Rapid "Crash Testing" for Continuously Evolving GUI-Based Software Applications
Several rapid-feedback-based quality assurance mechanisms are used to manage the quality of continuously evolving software. Even though graphical user interfaces (GUIs) are one of...
Qing Xie, Atif M. Memon
ISESE
2005
IEEE
16 years 4 days ago
Exploratory testing: a multiple case study
Exploratory testing (ET) – simultaneous learning, test design, and test execution – is an applied practice in industry but lacks research. We present the current knowledge of ...
Juha Itkonen, Kristian Rautiainen